Each new manufacturing process generation brings with it a whole new set of challenges. In an era of multimillion-gate complexity and increasing density of nanometer manufacturing defects, a key ...

Test compression sounds like magic. Read on to learn how this trick is done. Large, complex ICs are viable because their design meets test as well as functional requirements. Design for test (DFT) was ...

One of the easiest ways to test an engine's health is by checking its compression. Testing compression isn't something the average muscle car owner would do every year, but it is a useful tool to ...

For the past five years, the cost of test has prevailed as the hottest topic in test. During this period, automated test equipment (ATE) has made a dramatic move towards low-cost design for test (DFT) ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

Mission-critical applications within markets such as transportation and medical devices require higher overall manufacturing test quality, but that often means more test patterns, data volume, and ...

Test compression technology was invented to address the problem of escalating test-pattern size. Compression allows more test vectors to be applied to an IC in a shorter time and with fewer tester ...

This video demonstrates a compression test performed on a paper cup using a compression testing system from Instron. Instron compression testers are used to determine the compressive strength of ...