Electron microscopy is an exceptional tool for peering deep into the structure of isolated molecules. But when it comes to ...
TOKYO--(BUSINESS WIRE)--JEOL Ltd. (TOKYO:6951) (President & COO Izumi Oi) announced that it has developed semi-in-lens versions (i)/(is) which are optimal for the observation of semiconductor devices ...
In an effort to meet energy reduction commitments, lithium-containing compounds and alloys are essential to make progress. Though there have been undeniably enormous strides in developing these ...
Transmission Electron Microscope: FEI Talos F200s Scanning Transmission Electron Microscope (S/TEM) equipped with SuperX-EDS detector FEI Single Tilt Holder FEI Double Tilt Holder FEI Double Tilt ...
Today, ZEISS is introducing its new integrated in situ workflow for ZEISS field emission scanning electron microscopes (FE-SEM). When researchers need to link material performance to microstructure, ...
Engineers have developed a lanthanum hexaboride (LaB6) nanowire-based field emission gun that is installable on an aberration-corrected transmission electron microscope (TEM). This combined unit is ...
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