SANTA CLARA, Calif. — Advantest Corp. today announced it has begun selling new DRAM and flash memory tester that has the ability to simultaneously test up to 128 devices at a time with speeds of 143 ...
Memory automated test equipment (ATE) maker Tanisys Technology Inc. has entered the flash ATE market with the launch of its Darkhorse Sigma 4 Model 500 tester for flash. The Model 500 platform is ...
TOKYO--(BUSINESS WIRE)--Advantest Corporation (TSE: 6857, NYSE: ATE) today announced the availability of two new solutions for next-generation NAND flash memory test: the T5773 for package test and ...
T5773 and HA5100CELL are new solutions that accommodate high-capacity, high-speed, next-generation NAND flash memory devices from wafer test to volume production. The T5773 Test System provides ...
Teradyne Inc., a maker of electronic test equipment based in North Reading, reports it has agreed to spend $325 million to purchase San Jose-based Nextest Systems Corp. The acquisition would provide ...
TOKYO—Semiconductor test equipment supplier Advantest Corporation has announced its next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile ...
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