Abstract: Defect pattern recognition (DPR) of wafer maps is critical for determining the root cause of production defects, which can provide insights for the yield improvement in wafer foundries.
Abstract: Machine learning (ML) and pattern matching (PM) are powerful computer science techniques which can derive knowledge from big data, and provide prediction and matching. Since nanometer VLSI ...
Michael Carr is editor of the CMT Association's newsletter, Technically Speaking. He holds CMT Level II Investment Analyst and CRPC certification. Somer G. Anderson is CPA, doctor of accounting, and ...
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